Improving Yield Map Quality by Reducing Errors through Yield Data File Post-Processing
EC2005
Published 2015
Published 2015
Putting good data into the yearly crop management examination process is critical to ensuring the information is accurate and useful. This publication discusses many of the problems associated with creating yield maps from raw field data and potential methods for correcting many errors through post-processing, or cleaning, that data.
Publication Details
| Authors |
Joe Luck Nathan Mueller John P. Fulton |
|---|---|
| Subject | |
| Publication Date | September 04, 2015 |
| Last Revision Date | September 04, 2015 |
| Language | |
| Formats |
PDF (web) |
| Series | Extension Circular |