Improving Yield Map Quality by Reducing Errors through Yield Data File Post-Processing

Improving Yield Map Quality by Reducing Errors through Yield Data File Post-Processing

EC2005

Putting good data into the yearly crop management examination process is critical to ensuring the information is accurate and useful. This publication discusses many of the problems associated with creating yield maps from raw field data and potential methods for correcting many errors through post-processing, or cleaning, that data.

 

Details

AUTHORS

Joe Luck, Nathan Mueller, John P. Fulton

SUBJECT

Crops / Crop Production/Field Crops

PUBLICATION DATE

September 4, 2015

LAST REVISION DATE

None

LANGUAGE

N/A

FORMATS

PDF

SERIES

Extension Circular